December 27, 2012



Hitachi S-4800 FE-SEMHitachi S-4800 FE-SEM 02


Hitachi S-4800 FEGSEM: This field emission gun scanning electron microscope (FEGSEM) can achieve 30X to 800,000X magnification with a cold field emission gun at 0.5 to 30 kv accelerating voltage. This FEGSEM can detect transmitted electron (TE) for a TEM grid sample as well as secondary electron (SE) & back scattered electron (BSE) for dried samples.